YX-2產品特點：
此種機型為單晶衍射型普通精度定向儀,操作簡便,強度較高,可用于壓電晶體、光學晶體以及各種單晶晶體材料的檢測。
YX-2型:精度±30",數字顯示,最小讀數10"
其它技術參數基本相同, 詳見下面技術指標。
Features
YX-2 MODEL is single crystal diffraction type normal precision orientation instruments, which are easy for operation, with hig h intensity, applicable to the test of piezocrystal, optical crystal and other single crystal materials.
Model YX-2: precision ±30", scale display, minimum reading 10"
Other technical parameters are similar, please see the below followings.
技術指標
●輸 入 電 源: 單相交流電壓220V,50Hz,0.3kW
● X 射 線 管: 銅靶,風冷.管電壓:30kV,管電流:0~5mA
●計 數 器: 蓋革計數管
●時 間 常 數: 0.1、0.4、3秒三檔
●測 角 范 圍: θ=-10°~50°,2θ=-10°~100°
●角 度 讀 數: 刻度環上標出最小讀數為:2θ:1°,θ:1°;數字顯示:度 、分 、秒
●角 度 調 整: 數字顯示可設置在任意角度上
●狹 縫: 4', 5', 6'
●光 閘: 手動
●顯 示: 數字角度顯示
●綜 合 精 度:±30"
●外 形 尺 寸: 1140mm(長)X650mm(寬)X1030mm(高)
●重 量: 150kg
Technical Parameters
●Input power: Single-phase AC voltage with 220V,50Hz,0.3kW
●X-ray tube: Cu target, air cooling. Tube voltage: 30kV,
Tube current :0~5mA
●Counter: Geiger counter
●Time constant: 0.1s, 0.4s, 3s
●Testing Range of angle : θ=-10°~50°,2θ=-10°~100°
●Angel reading: the minimal read values marked on degree scale:2θ:1°,θ:1°;
Digital Displaying:degree, minute, second
●Angel adjustment: number can be displayed at any angle
●Slit range: 4', 5', 6'
●Optical Shuttle: manual
●Displaying: digital angle displaying
●Precision: ±30"
●Size:1140mm(L)X650mm(W)X1030mm(H)
●Weight:150kg
YX-2H8產品特點:
此種機型是在YX-2型單晶衍射定向儀的基礎上增加了承重直線導軌,并對樣品臺做了改進,可測1-30公斤,2-8英寸直徑藍寶石及各種單晶材料。
YX-2H8可配置 YA、 YB 、 YD 、YE 四種不同樣品臺, 客戶可按需求選擇上述配置。
YX-2H8型:精度±30",數字顯示,最小讀數10"
Features
On the basis of YX-2 model,this machine is added with bearing rail, improved sample table. It can measure Si sample with 1~30kg, 2~8 inches and various single crystal material.
YX-2H8 can be set with different goniometers YA 、 YB、 YD 、 YE. Customers can request the above configuration according to their needs.
Model Y X-2H8: precision ±30", digital display, minimum reading 10"
技術指標
●輸 入 電 源: 單相交流電壓220V,50Hz,0.3kW
● X 射 線 管: 銅靶,風冷.管電壓:30kV,管電流:0~5mA
●計 數 器: 蓋革計數管
●時 間 常 數: 0.1、0.4、3秒三檔
●測 角 范 圍: θ=-10°~50°,2θ=-10°~100°
●角 度 讀 數: 刻度環上標出最小讀數為:2θ:1°,θ:1°
●角 度 調 整: 數字顯示可設置在任意角度上
●狹 縫: 4', 5', 6'
●光 閘: 手動
●顯 示: 數字角度顯示
●綜 合 精 度: ±30"
●外 形 尺 寸: 1150mm(長)X665mm(寬)X1100mm(高)
●重 量: 170kg
Technical Parameters
●Input power: Single-phase AC voltage with 220V,50Hz,0.3kW
●X-ray tube: Cu target, air cooling. Tube voltage: 30kV,
Tube current :0~5mA
●Counter: Geiger counter
●Time constant: 0.1s, 0.4s, 3s
●Testing Range of angle :θ=-10°~ 50°,2θ=-10°~100°
●Angel reading: the minimal read values marked on degree scale: 2θ:1°,θ:1°
●Angel adjustment: number can be displayed at any angle
●Slit range: 4', 5', 6'
●Optical Shuttle: manual
●Displaying: digital angle displaying
●Precision: ±30"
●Size:1150mm(L)X665mm(W)X1100mm(H)
●Weight:170kg
YX－2H8型X射線晶體定向儀樣品臺
YX-2H8 X-RAY CRYSTAL ORIENTATION INSTRUMENT SAMPLE TABLE
YA樣品臺 YA model Sample Table
主要用于硅單晶或藍寶石的大型晶體柱面及片的檢測,增加了承重直線導軌,可測重1~30公斤,直徑2~8英寸棒。同時加有氣泵,可測2~8英寸晶片。
It is mostly used for testing the big crystal pillar and slice being composed with single crystal of Silicon and sapphire, whose weight is from 1 kg to 30kgs, and diameter from 2 inches to 8 inches. At the some time, adding the air pump to test the slice whose diameter from 2 inches to 8inches.
YB樣品臺 YB model Sample Table
主要用于硅單晶或藍寶石晶體的端面檢測,增加了承重直線導軌。樣品臺采用V型槽設計,V型槽的寬度可自動調整,便于不同規格大型圓柱形晶體在樣品臺上360°旋轉。人性化的設計,使設備更合理,可測重1~30公斤、直徑2~8英寸、長500mm棒材端面,同時加有氣泵,可測2~8英寸晶片。
It is mainly used for the cylindrical crystal of silicon and sapphire single crystal face detection, increasing the load-bearing track. The sample stage V-groove design, and can automatically adjust the width of the V-shaped groove. To facilitate the different specifications of a large cylindrical crystal radial 360°sample stage rotation. User-friendly design, and equipment is more reasonable, measurable, weight 1~30 kg, 2~8 inches in diameter, 500mm rods long face, adding pump can be measured 2~8 inches of sheet samples.
YD樣品臺 YD model Sample Table
主要用于硅單晶片或藍寶石晶片的外圓參考面的檢測,吸氣盤上接收X射線的位置采用開放式設計,克服了吸氣盤遮擋X射線和定位不準的問題,同時可滿足不同規格晶片參考邊的檢測。樣品臺的吸氣泵可把2~8英寸的晶片吸住,使檢測更加準確。
It is mainly used for the testing single chip of silicon and sapphire cylindrical reference surface, the suction plate to receive the location of the X-ray is the open design, to overcome the problem of the X-ray and positioning of the suction disk inorder to test the diffenert parameters erystal sample. The sample stage of the suction pump suck, 2~8 inch chip to make the detection more accurate.
YE樣品臺 YE model Sample Table
主要用于硅單晶和藍寶石等晶片的多點測量,晶片可在樣品臺上手動旋轉,如0°、90°、180°、270°等,可滿足客戶對晶片的特殊測量需求。
It is mostly used for testing the silicon and sapphire with more testing spots, whose testing sample stand can be rotated by operation, such as 0°90°、180°or 270°and others, in order to meeting the clients' special requirements.
檢測認證人脈交流通訊錄
