IC Tests (RA、FA、ESD、AECQ)

IC Accelerated  Environment Stress Tests：

PC / TCT / HTSL / PTC / HAST / UHST.

IC Accelerated Lifetime Simulation Tests:

HTOL / ELFR / EDR.

IC Package Assembly  Integrity  Tests:

WBS  /WBP / PD / SD / LI / SBS.

IC Electrical Verification Tests:

TEST / HBM / CDM / LU / ED / FG / CHAR / EMC / SC/ SER / LF).

Other Tests:

FIB\cratering\Decap\Delayer\X-section\SEM

IC authentication:

AEC-Q100 / AEC-Q104

     Guangzhou GRG Metrology & Test Co., Ltd. (stock abbreviation: GRGTEST, stock code: 002967) was established in 1964 and registered in the SME Board on November 8, 2019.

     GRGTEST has established a service support network with nationwide coverage. It has established 23 measurement and testing bases and more than 50 branches and subsidiaries in China, with a total laboratory area of more than 160,000 square meters and more than 15,000 sets of high-end equipment and instruments from home and abroad. The National Public Service Platform Integrating Measurement, Testing and Certification Technology can quickly respond to the requirements of customers and provide them with convenient and localized professional services.

IC Test Business consulting：

Michael Lee

TEL:+86 13808840060 ；

E-mail:lisz@grgtest.com